The multiple scattering profile in gamma ray Compton studies

Abstract

The spectrum of 662 keV gamma radiation, multiply scattered by a nickel sample, has been measured directly in a Compton scattering experiment at a scattering angle of 104°. Under these conditions the multiple profile extends well beyond the single and this affords an opportunity to check the Monte Carlo simulation commonly used to correct the single line shapes (Compton profiles). Measurements in reflection and transmission geometries on thin samples produced markedly different multiple profiles which were found to agree with the simulations within the statistical accuracy of the comparison. This provides the first direct validation of the multiple scattering correction procedure in Compton profile analysis. © 1986.