The Research on the Signal Generation Method and Digital Pre‐Processing Based on Time‐Interleaved Digital‐to‐Analog Converter for Analog‐to‐Digital Converter Testing

Abstract

In the high‐resolution analog circuit, the performance of chips is an important part. The performance of the chips needs to be determined by testing. According to the test requirements, stimulus signal with better quality and performance is necessary. The main research direction is how to generate high‐resolution and high‐speed analog signal when there is no suitable high‐resolution and high‐speed digital‐to‐analog converter (DAC) chip available. In this paper, we take the high‐resolution analog‐to‐digital converter (ADC) chips test as an example; this article uses highresolution DAC chips and multiplexers to generate high‐resolution high‐speed signals that can be used for testing high‐resolution ADC chips based on the principle of time‐alternating sampling. This article explains its method, analyzes its error and proposes a digital pre‐processing method to reduce the error. Finally, the actual circuit is designed, and the method is verified on the circuit. The test results prove the effectiveness of this method for generating high‐resolution ADC test signals.