A novel application of silicon microstrip technology for energy-dispersive EXAFS studies

Abstract

A prototype X-ray detector for energy-dispersive EXAFS has been developed and tested to demonstrate the principle of using silicon microstrip detector technology for this application. Testing took place at the UK Synchrotron Radiation Source, where the absorption spectra of a 5 μm Ni foil and a 25 mM NiCl2 solution were obtained.