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Infrared analysis of thin-film photovoltaic modules

Journal of Physics: Conference Series (2010) 214
DOI: 10.1088/1742-6596/214/1/012089
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Abstract

Distinctive hot spot phenomena caused by electrical shunts in thin-film modules are analyzed by infrared thermography. Modelling the shunt current by an equivalent circuit and considering lateral heat transport, the detected phenomena are discussed. Defects show a characteristic intense temperature rise (>12mK) in the center and an extended sphere of influence with reduced temperature rise. © 2010 IOP Publishing Ltd.

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Buerhop, C., & Bachmann, J. (2010). Infrared analysis of thin-film photovoltaic modules. In Journal of Physics: Conference Series (Vol. 214). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/214/1/012089

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