Multi-attribute analysis of micro-defect detection techniques suitable for automated production line of solar wafers and cells

Abstract

Renewable energy is going to play an immensely important role in the coming decades. Hence, the bulkmanufacturing of solar panels has seen a renewed interest. For this purpose, it is imperatively important to assess thetechniques that can be employed on automated production lines for evaluating the quality of solar wafers and cells. To-datemany non-destructive testing methods to access the micro-defects in solar wafers and cells have been developed around theglobe; however, not all of them can be applied on a fast-paced production line. In this regard, this study details all the nondestructive evaluating techniques that can be employed on an automated production line. Using a multi-attribute decisionmaking method, a strategic evaluation procedure is developed that can be adopted for the optimum selection of evaluation toolscurrently available in the market. This study is aimed at young researchers, graduate students and practitioners who want tocome up-to-speed regarding the various defects that occur in solar wafers and cells along with the techniques that are currentlybeing adopted to evaluate those defects. Also, future trends in research are highlighted regarding the development ofassessment techniques.