Abstract
Organic thin-film transistors using 5, 5 -diperfluorohexylcarbonyl- 2, 2′: 5′, 2″: 5″, 2 -quaterthiophene (DFHCO-4T) as the electron conducting organic semiconductor are fabricated and the performance of these transistors with different top-contact metals is investigated. Transistors with Au source-drain top contacts attain an apparent saturation mobility of 4.6 cm2/V s, whereas this parameter is 100 times lower for similar transistors with Al/LiF top contacts. We explain this lower performance by the formation of a thin interfacial layer with poor charge injection properties resulting from a redox reaction between Al and DFHCO-4T. © 2008 American Institute of Physics.
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CITATION STYLE
Schols, S., Van Willigenburg, L., Müller, R., Bode, D., Debucquoy, M., De Jonge, S., … Facchetti, A. (2008). Influence of the contact metal on the performance of n -type carbonyl-functionalized quaterthiophene organic thin-film transistors. Applied Physics Letters, 93(26). https://doi.org/10.1063/1.3059556
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