HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques

2Citations
Citations of this article
11Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

This paper describes the use of focused ion beam (FIB) techniques to fabricate Au nanoantenna structures for plasmonics applications. High-resolution transmission electron microscopy (HRTEM), diffraction and electron energy-loss spectroscopy (EELS) techniques are applied to investigate the structures of the initially patterned film, fabricated nanoantenna structures, and to map localized surface plasmon resonance (LSPR) modes in the nanostructures. © 2010 IOP Publishing Ltd.

Cite

CITATION STYLE

APA

Koh, A. L., Tomanec, O., Urbánek, M., Šikola, T., Maier, S. A., & McComb, D. W. (2010). HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques. In Journal of Physics: Conference Series (Vol. 241). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/241/1/012041

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free