Abstract
This paper describes the use of focused ion beam (FIB) techniques to fabricate Au nanoantenna structures for plasmonics applications. High-resolution transmission electron microscopy (HRTEM), diffraction and electron energy-loss spectroscopy (EELS) techniques are applied to investigate the structures of the initially patterned film, fabricated nanoantenna structures, and to map localized surface plasmon resonance (LSPR) modes in the nanostructures. © 2010 IOP Publishing Ltd.
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CITATION STYLE
Koh, A. L., Tomanec, O., Urbánek, M., Šikola, T., Maier, S. A., & McComb, D. W. (2010). HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques. In Journal of Physics: Conference Series (Vol. 241). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/241/1/012041
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