A wide band porous silicon omnidirectional mirror for the near infrared range

Abstract

We report the design, fabrication, and characterization of a porous silicon-based omnidirectional mirror for the near infrared range. The structure consists of 300 porous silicon chirped dielectric layers, optimized to have omnidirectional reflectivity response from 1000 to 2000 nm wavelength range. Measurements of reflectivity spectra are presented for non-polarized light at several incident angles (range 8°-65°) with a reflectivity .95% covering a 1 μm band-width. Transfer matrix method calculations were carried out to show the complete angular range for both TM and TE polarizations including a simple model to illustrate the interface scattering effects.