Optimal post-routing redundant via insertion

23Citations
Citations of this article
3Readers
Mendeley users who have this article in their library.
Get full text

Abstract

Redundant via insertion is highly recommended for improving chip yield and reliability. In this paper, we study the problem of double-cut via insertion (DVI) in a post-routing stage, where a single via can have at most one redundant via inserted next to it and the goal is to insert as many redundant vias as possible. The DVI problem can be naturally formulated as a zero-one integer linear program (0-1 ILP). Our main contributions are acceleration methods for reducing the problem size and the number of constraints. Moreover, we extend the 0-1 ILP formulation to handle via density constraints. Experimental results show that our 0-1 ILP is very efficient in computing optimal DVI solution, with up to 35.3 times speedup over existing heuristic algorithms. Copyright 2008 ACM.

Cite

CITATION STYLE

APA

Lee, K. Y., Koh, C. K., Wang, T. C., & Chao, K. Y. (2008). Optimal post-routing redundant via insertion. In Proceedings of the International Symposium on Physical Design (pp. 111–117). https://doi.org/10.1145/1353629.1353656

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free