Abstract
This study describes the concise exfoliation of multilayer Ti3C2Tx MXene containing residual aluminum atoms. Treatment with tetramethylammonium base in a co-solvent of tetrahydrofuran and H2O produced single-layer Ti3C2Tx, which was confirmed via atomic force microscopy observations, with an electrical conductivity 100+ times that of Ti3C2Tx prepared under previously reported conditions. The scanning electron microscopy and X-ray diffraction measurements showed that the exfoliated single-layer Ti3C2Tx MXenes were reconstructed to assembled large-domain layered films, enabling excellent macroscale electric conductivity. X-ray photoelectron spectroscopy confirmed the complete removal of residual Al atoms and the replacement of surface fluorine atoms with hydroxy groups. Using the exfoliated dispersion, a flexible transparent conductive film was formed and demonstrated in an electrical application.
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CITATION STYLE
Saita, E., Iwata, M., Shibata, Y., Matsunaga, Y., Suizu, R., Awaga, K., … Omachi, H. (2022). Exfoliation of Al-Residual Multilayer MXene Using Tetramethylammonium Bases for Conductive Film Applications. Frontiers in Chemistry, 10. https://doi.org/10.3389/fchem.2022.841313
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