Abstract
This study demonstrates the 2-axis epitaxial silicon scanner driven by the coil-less magnetostatic force using electroplated permanent magnet (CoNiMnP) film. The present approach has four merits: (1) the process employs the cheap silicon wafer with epitaxial layer; and the electrochemical etching stop technique is used to precisely control the thickness of scanner; (2) the I-section rib-reinforced structure is implemented to provide high stiffness of the mirror plate; (3) the magnetostatic driving force on scanner is increased by electroplated permanent magnet film with slender patterns; (4) the size of packaged scanner is reduced since the assembled permanent magnets are not required. © 2011 IEEE.
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Huang, H. Y., Tang, T. L., Sung, W. L., Lin, H. Y., & Fang, W. (2011). A magnetostatic 2-axis MEMS scanner with I-section rib-reinforcement and slender permanent magnet patterns. In 2011 16th International Solid-State Sensors, Actuators and Microsystems Conference, TRANSDUCERS’11 (pp. 2366–2369). https://doi.org/10.1109/TRANSDUCERS.2011.5969560
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