XPS insights: Sample degradation in X-ray photoelectron spectroscopy

Abstract

Standard X-ray photoelectron spectroscopy (XPS) analysis is thought of by many as a non-destructive form of analysis; however, both the interaction of the X-ray photons and the subsequent electron cascade can cause significant changes to the analysed area. This XPS Insights paper gives a brief overview to this phenomenon, supported by specific examples and experimental advice to assess and minimise damage during analysis.