Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

Lanza, M., Smets, Q., Huyghebaert, C., & Li, L. J. (2020, December 1). Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices. Nature Communications. Nature Research. https://doi.org/10.1038/s41467-020-19053-9