A high speed latched circuit for flash ADC

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Abstract

Practically all electronic systems are realized using integrated circuit(IC) chips. The IC design requires digital signals, but however the physical signals available routinely are either continuous time varying signals or corrupted discrete voltages. These continuous time varying input signals are converted to full voltage swing digital signals by means of a comparator circuit. The comparators use regenerative feedback to transform the output to a full scale digital signal. The core specifications considered in this comparator implementation are power dissipation (PD), propagation delay (tP), output offset voltage and slew rate. The circuit is simulated in CMOS 180nm technology using Tanner EDA tool. The high speed latched comparator circuit is powered with a 1.8V DC power supply and the obtained results show that it operates at 1.67GHz, slew rate is 126 V/µS and the dynamic power dissipation is found to be 0.328mW.

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APA

Al-Naamani, Y. M. A., Lokesh Krishna, K., Allabaksh, S., Shireesha, T., & Rekha, G. (2019). A high speed latched circuit for flash ADC. International Journal of Innovative Technology and Exploring Engineering, 8(12), 3741–3745. https://doi.org/10.35940/ijitee.L2665.1081219

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