Possibility to form nanometer-sized optical probe in an atomic force cantilevered SNOM

Abstract

We have studied a possibility to form nanometer-sized optical probe using prototype atomic force cantilevered SNOM and some fine structure samples. The system has an ability to obtain both atomic force microscope (AFM) and scanning near-field microscope (SNOM) images simultaneously. The fine optical probe was studied using the outside and inside Au coated SNOM probe. As experimental results, we have obtained a 10 nm-sized optical probe by observations of magneto-optical (MO) disc and Au thin film with many fine cracks. © 2007 IOP Publishing Ltd.