Abstract
Intense and ultrashort x-ray pulses from free-electron lasers open up the possibility for near-atomic resolution imaging without the need for crystallization. Such experiments require high photon fluences and pulses shorter than the time to destroy the sample. We describe results with a new femtosecond pump-probe diffraction technique employing coherent 0.1 keV x rays from the FLASH soft x-ray free-electron laser. We show that the lifetime of a nanostructured sample can be extended to several picoseconds by a tamper layer to dampen and quench the sample explosion, making <1nm resolution imaging feasible. © 2010 The American Physical Society.
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CITATION STYLE
Hau-Riege, S. P., Boutet, S., Barty, A., Bajt, S., Bogan, M. J., Frank, M., … Chapman, H. N. (2010). Sacrificial tamper slows down sample explosion in FLASH dffraction eperiments. Physical Review Letters, 104(6). https://doi.org/10.1103/PhysRevLett.104.064801
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