By employing the optical-beam-induced current (OBIC) measurement technique, we have analyzed the sudden and wear-out failure of optical devices. The extent of the degraded region is estimated by using relative OBIC intensity prior to aging. The use of OBIC incident sources at several wavelengths enables us to detect degradation in facets, epitaxial layers, and the device interior.
CITATION STYLE
Takeshita, T. (2013). Failure analysis using optical evaluation technique (OBIC) of LDs and APDs for fiber optical communication. In Materials and Reliability Handbook for Semiconductor Optical and Electron Devices (pp. 55–85). Springer New York. https://doi.org/10.1007/978-1-4614-4337-7_3
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