Journal ArticleOPEN ACCESS

In Situ Electrical Characterization of Single Nanofibers Using a Nanomanipulator in an FIB/SEM Microscope

  • Roelofs K
  • Xu S
  • Poirier G
  • et al.
Microscopy and Microanalysis (2010) 16(S2) 1800-1801
DOI: 10.1017/s1431927610062070
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Roelofs, K., Xu, S., Poirier, G., & Yao, N. (2010). In Situ Electrical Characterization of Single Nanofibers Using a Nanomanipulator in an FIB/SEM Microscope. Microscopy and Microanalysis, 16(S2), 1800–1801. https://doi.org/10.1017/s1431927610062070

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