Simple X-ray speckle-pattern correlation interferometer

Abstract

Speckle-pattern correlation interferometry (SPCI) is a well established technique in the visible-light regime for observing surface disturbances. It has found application in non-destructive testing of materials, as well as in medicine. A method of performing SPCI in the X-ray regime is presented. Instead of using surface reflection, small-angle scattering is utilized. The simple geometry consists of one coherent X-ray beam passing through two samples. The calculated resultant speckle field shows highly enhanced sensitivity to relative motion of the samples. Motions are simulated and their corresponding correlation patterns are calculated. Initial experimental results are presented.