Efficient Fourier shape descriptor for industrial defect images using wavelets

Abstract

The use of image retrieval and classification has several applications in industrial imaging systems, which typically use large image archives. In these applications, the matter of computational efficiency is essential and therefore compact visual descriptors are necessary to describe image content. A novel approach to contour-based shape description using wavelet transform combined with Fourier transform is presented. The proposed method outperforms ordinary Fourier descriptors in the retrieval of complicated industrial shapes without increasing descriptor dimensionality. © 2005 Society of Photo-Optical Instrumentation Engineers.