On the reliability of highly magnified micrographs for structural analysis in materials science

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Abstract

Highly magnified micrographs are part of the majority of publications in materials science and related fields. They are often the basis for discussions and far-reaching conclusions on the nature of the specimen. In many cases, reviewers demand and researchers deliver only the bare minimum of micrographs to substantiate the research hypothesis at hand. In this work, we use heterogeneous poly(acrylonitrile) nanofiber nonwovens with embedded nanoparticles to demonstrate how an insufficient or biased micrograph selection may lead to erroneous conclusions. Different micrographs taken by transmission electron microscopy and helium ion microscopy with sometimes contradictory implications were analyzed and used as a basis for micromagnetic simulations. With this, we try to raise awareness for the possible consequences of cherry-picking for the reliability of scientific literature.

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Wortmann, M., Layland, A. S., Frese, N., Kahmann, U., Grothe, T., Storck, J. L., … Ehrmann, A. (2020). On the reliability of highly magnified micrographs for structural analysis in materials science. Scientific Reports, 10(1). https://doi.org/10.1038/s41598-020-71682-8

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