Analytical Instrumentation Techniques of FT-IR, XRD, SEM, and EDX for Adsorption Methods of Ni2+ Ions onto Low Cost Adsorbent

Abstract

The present study investigates the possible removal of Ni2+ ions from aqueous solution by using low-cost Hygrophila auriculata activated nano carbon (HA-ANC) as an adsorbent. The activated nano carbon had been prepared from Hygrophila auriculata stem waste as well; the raw material was carbonized with con. H2SO4 and activated by thermal action. Batch experiments were performed in order to calculate the percentage removal of Ni2+ ions for 90.737% at 60 oC. The properties of treated carbon and untreated carbon are compared using instrumental techniques such as FT-IR, XRD, SEM and EDX, which confirms Ni2+ ions adsorption onto HA-ANC. FT-IR showed that the surface of HA-ANC had more oxygen containing functional groups which enhanced the adsorption of Ni2+. XRD showed the nature of adsorbent, SEM images implies morphological deviance of before and after adsorption of Ni2+ onto HA-ANC and EDX showed that the C content of HA-ANC were higher than that of Ni2+/ HA-ANC.