The dramatic effect of the annealing temperature and dielectric functionalization on the electron mobility of indene-C60 bis-adduct thin films

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Abstract

Herein we report on the charge transport properties of spin-coated thin films of an n-type fullerene derivative, i.e. the indene-C60 bis-adduct (ICBA). In particular, the effects of annealing temperature and duration as well as surface functionalization are explored. Electron mobilities approaching 0.1 cm2 V-1 s-1 are reported. This journal is

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Orgiu, E., Squillaci, M. A., Rekab, W., Börjesson, K., Liscio, F., Zhang, L., & Samorì, P. (2015). The dramatic effect of the annealing temperature and dielectric functionalization on the electron mobility of indene-C60 bis-adduct thin films. Chemical Communications, 51(25), 5414–5417. https://doi.org/10.1039/c5cc00151j

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