XPS Analysis of Passive Film on Stainless Steel

  • Natarajan R
  • Palaniswamy N
  • Natesan M
  • et al.
N/ACitations
Citations of this article
50Readers
Mendeley users who have this article in their library.
Get full text

Abstract

Potentiodynamic, impedance measurements were carried out on 304 stainless steel in 0.5N, 1.0, 2.0 and 5.0 N H 2 SO 4 solutions. X-ray photoelectron spectroscopic [XPS] studies carried out on 304 stainless steel in H 2 SO 4 solutions revealed the existence of CrOOH, Cr 2 O 3 ,-Fe 2 O 3 ,-FeOOH, Mn 2 O 3 , Mn 3 O 4 , MnS, Ni (OH) 2 , Ni 2 O 3 , NiO, sulphides. The passive film found to contain chromium oxide inner layer and the dissolution of iron through it caused the formation of oxides of iron namely-Fe 2 O 3 and-FeOOH. Higher oxides of manganese and nickel are also due to dissolution through the film. Sulphates are reduced to sulphur chemically by the released protons from anodic polarization.

Cite

CITATION STYLE

APA

Natarajan, R., Palaniswamy, N., Natesan, M., & Muralidharan, V. S. (2009). XPS Analysis of Passive Film on Stainless Steel. The Open Corrosion Journal, 2(1), 114–124. https://doi.org/10.2174/1876503300902010114

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free