Abstract
Transient behavior in switching operation of junction field-effect transistors (JFETs) is affected by their intrinsic parasitic capacitances. This paper focuses on the switching operation of lateral- type and vertical-type SiC JFETs with considering the charge/discharge behavior of parasitic capacitances in the device. Their device structure decides the voltage dependency of the capacitance characteristics, so that the C -V characteristics governs their switching behavior. © IEICE 2010.
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Phankong, N., Funaki, T., & Hikihara, T. (2010). Switching characteristics of lateral-type and vertical-type SiC JFETs depending on their internal parasitic capacitances. IEICE Electronics Express, 7(14), 1051–1057. https://doi.org/10.1587/elex.7.1051
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