Determination of stress profiles in expanded austenite by combining successive layer removal and GI-XRD

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Abstract

The present work deals with the evaluation of the residual-stress profile in expandedaustenite by successive removal steps using GI-XRD. Preliminary results indicate stresses of several GPa's from 111 and 200 diffraction lines. These stresses appear largest for the 200 reflection. The strain-free lattice parameter decayed smoothly with depth, while for the compressive stress a maximum value is observed at some depth below the surface. Additionally a good agreement was found between the nitrogen profile determined with GDOES analysis and the strain-free lattice parameter from XRD. © (2014) Trans Tech Publications, Switzerland.

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Fernandes, F. A., Christiansen, T. L., & Somers, M. A. J. (2014). Determination of stress profiles in expanded austenite by combining successive layer removal and GI-XRD. In Advanced Materials Research (Vol. 996, pp. 155–161). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/AMR.996.155

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