Abstract
AFM Application in III-Nitride Materials and Devices | InTechOpen, Published on: 2012-03-23. Authors: Z. Chen, L.W. Su, J.Y. Shi, et
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APA
Chen, Z., Su, L. W., Shi, J. Y., Wang, X. L., Tang, C. L., & Gao, P. (2012). AFM Application in III-Nitride Materials and Devices. In Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale. InTech. https://doi.org/10.5772/37527
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