Optical metrology embraces deep learning: keeping an open mind

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Abstract

Optical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits.

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APA

Pan, B. (2022). Optical metrology embraces deep learning: keeping an open mind. Light: Science and Applications, 11(1). https://doi.org/10.1038/s41377-022-00829-1

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