Abstract
Optical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits.
Cite
CITATION STYLE
APA
Pan, B. (2022). Optical metrology embraces deep learning: keeping an open mind. Light: Science and Applications, 11(1). https://doi.org/10.1038/s41377-022-00829-1
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