Transmission electron microscopy and diffractometry of materials. By B. Fultz and J. M. Howe. pp. xix + 748pp. Heidelberg: Springer-Verlag, 2001. Price DM 179.00, US $89.95. ISBN 3-540-67841-7.

Douglas L. Dorset

Journal ArticleOPEN ACCESS

Transmission electron microscopy and diffractometry of materials. By B. Fultz and J. M. Howe. pp. xix + 748pp. Heidelberg: Springer-Verlag, 2001. Price DM 179.00, US $89.95. ISBN 3-540-67841-7.

Dorset D

Journal of Applied Crystallography (2002) 35(1) 145-146

DOI: 10.1107/s0021889801020532

N/ACitations

8Readers

Abstract

… of the electron crystallography of hard materials remains to be written. This should include the use of Rietveld refinement of … analysis of electron micrographs and electron diffraction …

Cite

CITATION STYLE

APA

Dorset, D. L. (2002). Transmission electron microscopy and diffractometry of materials. By B. Fultz and J. M. Howe. pp. xix + 748pp. Heidelberg: Springer-Verlag, 2001. Price DM 179.00, US $89.95. ISBN 3-540-67841-7. Journal of Applied Crystallography, 35(1), 145–146. https://doi.org/10.1107/s0021889801020532

Transmission electron microscopy and diffractometry of materials. By B. Fultz and J. M. Howe. pp. xix + 748pp. Heidelberg: Springer-Verlag, 2001. Price DM 179.00, US $89.95. ISBN 3-540-67841-7.

Abstract

Cite

Register to see more suggestions