Control of microstructure in (001)-orientated FePt-SiO2 granular films

Abstract

Highly ordered L 10 FePt-Si O2 granular films with a (001)-preferred orientation were obtained by depositing atomic-scale [FePtSi O2 (tox)] multilayers on glass substrates and subsequently annealing multilayers at the temperature of as low as 350 °C. The tox value plays an important role on both microstructure and magnetic properties. The average grain sizes of samples A, B, and C (tox =0.11,0.28,0.56) are 12.12, 15.46, and 5.14 nm, respectively, and the corresponding perpendicular coercivities are 6800, 5550, and 7700 Oe. Due to different microstructures, samples show distinct coercivity dependence on annealing time. © 2008 American Institute of Physics.