Monitoring DNA hybridization by quantification of nitrogen content using X-ray photoelectron spectroscopy

Abstract

X-ray photoelectron spectroscopy (XPS) was used to detect hybridization of surface-immobilized oligonucleotides for potential quantification of surface coverage and hybridization efficiency. XPS offers an alternative to DNA analysis with fluorescence radioisotope detection. The nitrogen content and the ratio of nitrogen from DNA to sulfur from alkanethiols introduced in surface immobilization was used as a proof of hybridization with statistical errors of less than 20%. © 2007 The Japan Society of Applied Physics.