Automated Lattice Orientation Determination From ElectronBackscatter Kikuchi Diffraction Patterns

Abstract

The ability to measure individual orientations from crystallites enables a more complete characterization of the microstructure. A primary obstacle to the use of single orientation measurements is the large investment of direct operator time necessary to obtain a statistically reliable data set. The most viable technique for obtaining individual orientation measurements is electron backscatter Kikuchi diffraction (BKD). Current technology requires an operator to identify a zone axis pair in a BKD pattern. This paper describes research in progress to automate the identification of lattice orientation from BKD patterns by identifying the planes associated with the bands that appear in the patterns. This work considered FCC crystal symmetry.