Abstract
Ferroelectric nanostructures are important for a variety of applications in electronic and electro-optical devices, including nonvolatile memories and thin-film capacitors. These applications involve stability and switching of polarization using external stimuli, such as electric fields. We present a theoretical model describing how the shape of a nanoparticle affects its polarization in the absence of screening charges, and quantify the electron-optical phase shift for detecting ferroelectric signals with phase-sensitive techniques in a transmission electron microscope. We provide an example phase shift computation for a uniformly polarized prolate ellipsoid with varying aspect ratio in the absence of screening charges. © 2014 American Physical Society.
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CITATION STYLE
Phatak, C., Petford-Long, A. K., Beleggia, M., & De Graef, M. (2014). Theoretical study of ferroelectric nanoparticles using phase reconstructed electron microscopy. Physical Review B - Condensed Matter and Materials Physics, 89(21). https://doi.org/10.1103/PhysRevB.89.214112
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