Abstract
A new scattering technique in grazing-incidence X-ray diffraction geometry is described which enables three-dimensional mapping of reciprocal space by a single rocking scan of the sample. This is achieved by using a two-dimensional detector. The new set-up is discussed in terms of angular resolution and dynamic range of scattered intensity. As an example the diffuse scattering from a strained multilayer of self-assembled (In,Ga)As quantum dots grown on GaAs substrate is presented. © 2008 International Union of Crystallography.
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Schmidbauer, M., Schäfer, P., Besedin, S., Grigoriev, D., Köhler, R., & Hanke, M. (2008). A novel multi-detection technique for three-dimensional reciprocal-space mapping in grazing-incidence X-ray diffraction. Journal of Synchrotron Radiation, 15(6), 549–557. https://doi.org/10.1107/S0909049508023856
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