Reliability analysis and fault-tolerant operation in a multilevel inverter for industrial application

Abstract

The extensive employment of power semiconductor devices in multilevel inverters (MLIs) has the consequence of increased failure probabilities. With numerous applications demanding highly reliable inverters, several fault-tolerant schemes have been devised to address switch open-circuit faults. This paper analyzes a multilevel inverter topology for IGBT modules undergoing open-circuit faults, a major impediment to reliable operation within a power converter. Reconfiguration of modulation is performed post-fault. A modulation scheme is implemented across failure modes as a hybrid of nearest level control and selective harmonic elimination. Reliability assessment of the topology is performed, including a comparison with previous literature in terms of component requirements and reliability. Simulation results validate the proposed solutions.