Phase transformation in sputter-deposited PdMn and PdPtMn thin films

Abstract

The phase transformations of PdMn and PdPtMn films were investigated using differential scanning calorimetry (DSC), x-ray diffraction (XRD), and transmission electron microscopy (TEM). The enthalpy for the fcc to L 10 transformation in the PdMn and PdPtMn thin films has been measured by DSC as -5.4 and -7.6 kJmol at., respectively. The fcc to L 10 phase transformation was identified by XRD and TEM on as-deposited and annealed samples. The transition temperature for the PdPtMn is approximately 40 °C lower than that for PdMn. PdPtMn thin films have better corrosion resistance than PdMn. © 2006 American Institute of Physics.