Implementation of a 900 V Switching Circuit for High Breakdown Voltage β-Ga 2 O 3 Schottky Diodes

  • Chen Y
  • Yang J
  • Ren F
  • et al.
21Citations
Citations of this article
36Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

© The Author(s) 2019. This paper presents a switching circuit for high breakdown-voltage Ga2O3 vertical Schottky rectifiers. Field-plated edge-terminated (FPET) vertical Schottky diodes were fabricated on a 20-μm thick Si-doped n-type Ga2O3 drift layer which was grown on the 650-μm thick β-Ga2O3 substrate via halide vapor phase epitaxy (HVPE). The measured reverse recovery time of the proposed Ga2O3 Schottky diode was 81 ns when switched to a reverse bias voltage of −900 V. The implementation of a switching circuit with the novel Ga2O3 diode is the first demonstrated at such a high switching voltage. This paper also provides insights for the practical implementation of the Ga2O3 vertical Schottky rectifiers from device fabrication to circuit design.

Cite

CITATION STYLE

APA

Chen, Y.-T., Yang, J., Ren, F., Chang, C.-W., Lin, J., Pearton, S. J., … Liao, Y.-T. (2019). Implementation of a 900 V Switching Circuit for High Breakdown Voltage β-Ga 2 O 3 Schottky Diodes. ECS Journal of Solid State Science and Technology, 8(7), Q3229–Q3234. https://doi.org/10.1149/2.0421907jss

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free