A critical study on the reliability of electron temperature measurements with a langmuir probe

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Abstract

Electron temperature deduced from a contaminated Langmuir probe is discussed. Laboratory and rocket experiments show that electron temperature evaluation is higher than the true value when the probe has a contaminated surface. It is concluded that the high temperature of the E-region is also due to the use of such a contaminated Langmuir probe. Hysteresis phenomenon can be explained by means of the simple equivalent circuit for the contamination layer of a probe surface. © 1972, Society of Geomagnetism and Earth, Planetary and Space Sciences. All rights reserved.

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Hirao, K., & Oyama, K. (1972). A critical study on the reliability of electron temperature measurements with a langmuir probe. Journal of Geomagnetism and Geoelectricity, 24(4), 415–427. https://doi.org/10.5636/jgg.24.415

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