Abstract
As CMOS technology is scaled, it has become increasingly difficult for conventional copper interconnect to satisfy different design requirements. On-chip optical interconnect has been considered as a potential substitute for electrical interconnect. In this paper, predictions of the performance of CMOS compatible optical devices are made based on current state-ofart optical technologies. Based on these predictions, electrical and optical interconnects are compared for delay uncertainty, latency, power, and bandwidth density. © 2006 IEEE.
Cite
CITATION STYLE
Chen, G., Chen, H., Haurylau, M., Nelson, N. A., Albonesi, D. H., Fauchet, P. M., & Friedman, E. G. (2006). On-chip copper-based vs. optical interconnects: Delay uncertainty, latency, power, and bandwidth density comparative predictions. In 2006 International Interconnect Technology Conference, IITC (pp. 39–41). https://doi.org/10.1109/IITC.2006.1648640
Register to see more suggestions
Mendeley helps you to discover research relevant for your work.