DETERMINATION OF CRYSTALLOGRAPHIC TEXTURES FROM SELECTED AREAS OF A SPECIMEN BY ELECTRON DIFFRACTION.

Abstract

A technique for the determination of partial pole figures with an angular resolution of less than 3 degree from selected areas of a thin foil is described. A microcomputer interfaced to an unmodified electron microscope is used to scan a diffraction pattern over a detector, tilt the specimen in steps of 1. 5 degree over a range of plus or minus 50 degree , and plot the resulting data as a semiquantitative pole figure. Application to the study of materials which deform inhomogeneously is discussed, and examples are given of pole figures obtained from deformed single phase and two phase aluminum specimens.