Abstract
The scaling of anomalous Hall resistivity on longitudinal resistivity has been intensively studied in different magnetic systems, including multilayer and granular films, to examine whether a skew scattering or a side jump mechanism dominates in the origin of anomalous Hall effect (AHE). The scaling law is based on the premise that both resistivities are a consequence of electron scattering by the imperfections in the materials. By studying the anomalous Hall effect in the simple Fe/Cu bilayers, it was demonstrated that the measured anomalous Hall effect should not follow the scaling laws derived from skew scattering or side jump mechanism due to the short-circuit and shunting effects of the non-magnetic layers. © 2008 Springer.
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CITATION STYLE
Xu, W. J., Zhang, B., Wang, Z., Chu, S. S., Li, W., Wu, Z. B., … Zhang, X. X. (2008). Scaling law of anomalous Hall effect in Fe/Cu bilayers. European Physical Journal B, 65(2), 233–237. https://doi.org/10.1140/epjb/e2008-00350-3
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