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Combination of scanning probe microscopy techniques for evaluating the electrical parameters of individual multiwalled carbon nanotubes

IOP Conference Series: Materials Science and Engineering (2017) 256(1)
DOI: 10.1088/1757-899X/256/1/012018
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Abstract

Using two techniques of scanning probe microscopy, the electrical properties (work function, Fermi level position, free carriers' concentration, electrical resistance, conductivity, and carriers' mobility) of individual multiwalled carbon nanotubes were evaluated.

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Sokolov, D. V., Davletkildeev, N. A., Bolotov, V. V., & Lobov, I. A. (2017). Combination of scanning probe microscopy techniques for evaluating the electrical parameters of individual multiwalled carbon nanotubes. In IOP Conference Series: Materials Science and Engineering (Vol. 256). Institute of Physics Publishing. https://doi.org/10.1088/1757-899X/256/1/012018

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