Cu-Zn-Sn-S Thin Films from Electrodeposited Metallic Precursor Layers

  • N. Bhattacharya R
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Abstract

Cyclic voltammogram of ionic liquid and metallic-salts in ionic liquids were recorded. Cu/Sn/Zn stacked layers were electrodeposited and subsequently sulfurized in a tube furnace in elemental sulfur at 550ºC. Thin films were characterized by X-ray diffraction, ICP-MS, and SEM. The device was characterized by I-V, QE and Mott-Schottky (capacitance-voltage) plot.

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N. Bhattacharya, R. (2012). Cu-Zn-Sn-S Thin Films from Electrodeposited Metallic Precursor Layers. The Open Surface Science Journal, 4(1), 19–24. https://doi.org/10.2174/1876531901204010019

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