Growth and characterization of AlxGa1-xN lateral polarity structures

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Abstract

AlGaN lateral polarity structures (LPS) with varying Al composition, have been fabricated by metalorganic chemical vapour deposition on LPS templates containing μm size domains. III-metal and N-polar AlGaN domains have been grown on LT-AlN and c-sapphire domains, respectively. LPS characterization by SEM and AFM reveals two major effects when the Al composition has been varied: (a) A high Al content leads to columnar growth within N-polar domains and (b) a height difference between the polar domains can be observed for low Al compositions towards III-polarity. The surface quality of the III-polar domains is not effected by the Al composition. The surface roughness of N-polar domains decreases for lower Al compositions. The high periodicity of the polar domains and the high quality of the boundary between domains suggest a high potential of AlGaN LPS to be used as lateral wave guides for quasi phase matching.

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Hoffmann, M. P., Kirste, R., Mita, S., Guo, W., Tweedie, J., Bobea, M., … Sitar, Z. (2015). Growth and characterization of AlxGa1-xN lateral polarity structures. Physica Status Solidi (A) Applications and Materials Science, 212(5), 1039–1042. https://doi.org/10.1002/pssa.201431740

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