Angle-resolved photoemission spectroscopy (ARPES) and X-ray photoemission spectroscopy have been used to characterise epitaxially ordered graphene grown on copper foil by low-pressure chemical vapour deposition. A short vacuum anneal to 200 °C allows observation of ordered low energy electron diffraction patterns. High quality Dirac cones are measured in ARPES with the Dirac point at the Fermi level (undoped graphene). Annealing above 300 °C produces n-type doping in the graphene with up to 350 meV shift in Fermi level, and opens a band gap of around 100 meV. Dirac cone dispersion for graphene on Cu foil after vacuum anneals (left: 200 °C, undoped; right: 500 °C, n-doped). Centre: low energy electron diffraction from graphene on Cu foil after 200 °C anneal. Data from Antares (SOLEIL). © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
CITATION STYLE
Marsden, A. J., Asensio, M. C., Avila, J., Dudin, P., Barinov, A., Moras, P., … Bell, G. R. (2013). Is graphene on copper doped? Physica Status Solidi - Rapid Research Letters, 7(9), 643–646. https://doi.org/10.1002/pssr.201307224
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