Detection of Apple Defects Based on the FCM-NPGA and a Multivariate Image Analysis

Abstract

In existing machine vision technology for fruit defects, the hue appears different, and the defect area is small due to the irregularity of illumination reflection from the surface incident light source, this makes it difficult to extract the defect area. Thus, we proposed an apple defect detection method based on the Fuzzy C-means Algorithm and the Nonlinear Programming Genetic Algorithm (FCM-NPGA) in combination with a multivariate image analysis. First, the image was denoised and enhanced through fractional differentiation. The noise points and edge points were removed, and the important texture information was preserved. Then, the FCM-NPGA algorithm was used to segment the suspicious defect graph. Finally, a method based on a multivariate image analysis strategy was used to detect the flaws of the apple's suspicious defect map. The application results of 2000 images showed that the overall detection accuracy was 98%. Experiments show that the apple defect detection algorithm based on FCM and NPGA combined with multi-image analysis method is effective.