The {110} reflection in X-ray diffraction of MXene films: Misinterpretation and measurement via non-standard orientation

Abstract

It has been claimed that disappearance of the {110} reflection in powder X-ray diffraction of MXene films and powders is indicative of shearing or general disorder of restacking of the flakes. Here we show this to be incorrect and provide experimental justification. The disappearance of this peak arises from a combination of sample texture and orientation. Furthermore, our methods provide a simple way to estimate a unit cell parameters when the relevant reflections are not present in most reports of MXene films.