Journal ArticleOPEN ACCESS

Improved Mass Resolving Power and Yield in Atom Probe Tomography

  • Larson D
  • Prosa T
  • Bunton J
  • et al.
Microscopy and Microanalysis (2013) 19(S2) 994-995
DOI: 10.1017/s143192761300696x
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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APA

Larson, D. J., Prosa, T. J., Bunton, J. H., Olson, D. P., Lawrence, D. F., Oltman, E., … Kelly, T. F. (2013). Improved Mass Resolving Power and Yield in Atom Probe Tomography. Microscopy and Microanalysis, 19(S2), 994–995. https://doi.org/10.1017/s143192761300696x

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