In-house-built single-crystal anomalous X-ray diffraction measurement system using white X-rays and an energy dispersive detector

Abstract

A single crystal X-ray diffraction (XRD) measurement system composed of white X-rays from an in-house X-ray generator, a four-circle diffractometer, and a compact energy dispersive detector was constructed to acquire XRD data including the effect of anomalous scattering of X-rays with selective energy. The obtained data are available for crystal structure analysis to determine the atomic positions of a specific element by the ¤- synthesis method. A single crystal of Sr3Y(BO3)3 containing neighboring elements of Sr and Y, which could not be distinguished by conventional XRD analysis, was tested to demonstrate the performance of the present system.