Solution-TiO2 interface probed by frequency-modulation atomic force microscopy

Abstract

The topography and solvation structure of a solution-TiO2 interface were observed in the dark using highly sensitive, frequency-modulated atomic force microscopy (FM-AFM). The nucleation and growth of an ionic solute, KCl, in this study, were observed in constant frequencyshift topography. The force applied to the tip was determined as a function of tip-surface distance. Modulations were identified on some force curves and were found to be related to the site-specific density of water molecules. © 2009 The Japan Society of Applied Physics.